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NFA100-E

NFA100-E Nand Flash Tester


NFA100-E is an extremely powerful and flexible NAND Flash testing platform specially developed for R&D personnel whereby they can extract NAND Flash parameters in a maximal way by using NFA100-E system commands and even reprocess these parameters for eventual product development. User can also realize their specific testing requirements through API or usage of script commands.

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Basic SpecsOrder Info


 Application

NFA100-E is developed for Flash Memory Controller developing engineers, professors, masters or doctors who are engaged in research of NAND Flash, and personnel from specific institutions doing research on reliability of Flash memory.

Technology Specification

1. Support 3D NAND with newest process, 1xnm, 25nm, 34nm, and 56nm NAND

2. Support SLC, MLC, TLC and eMLC Type NAND

3. Support 8-bit and 16-bit Asynchronous NAND

4. Support Synchronous, Toggle NAND

5. Support regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk, Hynix

6. Support NAND with TSOP48, BGA63, BGA100, BGA132 and BGA152 package

7. Customized socket for NAND with unconventional package


Measurement Accuracy & Efficiency

1. Panel PC is connected with Main Test Board via USB2.0. Measurement is operated by FPGA test board and little resources of Panel PC is consumed. USB2.0 is only used to transfer test result to software running on Panel       PC. Such designs make sure that NFA100-E does not cause deviation with measurement data outputs by itself.

2. Measurement efficiency depends on performance of tested NAND and the specific measurement terms. For example, if NFA100-E is used to measure P/E cycle, the time taken for measurement depends on Blocks set to be

   measured, pattern settings and the performance of the NANDs


Special Purpose
1. Test the ability of BCH ECC or LDPC self-developed

2. Test Read Retry

3. Test NAND Flash at varying voltage

4. Test of physical destroy over NAND Flash


Breif Introduction

NFA100-E is a powerful while easy-to-use NAND analysis kit, which is able to satisfy users' request to obtain basic raw info of NAND and to reprocess these information.

1. NFA100-E is able to provide comprehensive raw data of NAND Flash.
   Analysis of NAND Flash can only be done by sending Commands to NAND and then reading the outputs.

   Besides common commands such as Erase, Programm, Read, Get ID, etc., NFA100-E is also able to send specific commands such as Set Feature or Get Feature, so that users can make verification on ReadRetry(RR) 
   of NAND Flash.

    Furthermore, users of NFA100-E is allowed to customize commands(1-byte command) for special test purposes.
2. NFA100-E is able to reprocess raw data of NAND.
   NFA100 is approved to be powerful to reprocess NAND raw data.

   Also Renice is able to develop specific algorithm for clients’ customized demand, such as bad block detection or nand sorting.


NFA100-E supports all mainstream NAND Flash. For specific NAND not on the list, Renice is able to make supplement based on Data Sheets provided by clients.



支持所有主流厂商闪存



Meanwhile, NFA100-E equipped with complete socket suit, supports all common NAND package type.



支持各种封装类型



NFA100-E supports Sync/Async, MLC/SLC/TIC, 16K page size, 3D NAND Flash, etc. NFA100-E also enable users to set Base Clock and test converting MLC into SLC type.



支持同步、异步闪存测试



NFA100-E supports flexible settings of Pattern. It enable users to implement various and even customized test over Block and Page.



支持对page、Block进行各种Pattern的设定



Besides these ready-made settings, NFA100-E also delivers Script Generator, based on which users can define test parameters by themselves.



Nand Flash测试脚本


NFA100-E delivers 2 levels of open developing platform for users to design test items as per own request.

 


1. API


By different operations or settings of NAND Flash in API, users are able to call programs from NFA100-E's library to customize the tests.


2. Script


NFA100-E provides own programming language allowing clients to run custom script.



Main Function


After making above basic settings, users is able to make required measurements, such as Bad Block Scanning or Management



Nand Flash坏块扫描和管理



Sending commands to NAND Flash



对Nand Flash发送命令



P/E Cycle Measurement



P/E Cycle测试



RBER (Raw-Bit Error Rate) and UBER (Uncorrectable Bit Error Rate) Measurement



原始比特误码率RBER测试



Date Retention Measurement



数据保存时间Data Retention测试



Program Disturb Measurement. Output graph shows clearly the distribution of Bit Error and Page Error



编程干扰program disturb测试



Operation Time Measurement. Output helps users to analyze the distribution of the Upper Page and Lower Page



Nand Flash的快页upper page和慢页lower page测试

NFA100-E / NFA100

 

 NFA100-E

 NFA100

 

Application


Mainly developed for R&D purpose. NFA100-E is able to help R&D engineering to find and fix problems in NAND Flash  designing.

Fit for research institutions, universities, and enterprises.

Mainly developed for Mass Production purpose. Fit for large scale tests and NAND Flash  sorting.

No. of NAND

Test up to 4 PCs of NAND Flash @ 1 time

Test up to 128 PCs of NAND Flash @ 1 time


PC Connection


USB2.0


USB3.0 & Ethernet  

NFA100 deploys distributed structure. Each Sub-board is designed with independent NAND controller. Parts of test do not take up the Host resources. Thus operation time of NFA100 is shorter than of NFA100-E.

Max design Write Speed: 1GB/s

Max design Read Speed: 1.5GB/s

  

For remote Demo or presentation please contact us via email sales@renice-tech.com

NFA100-E Vedio:

Back

 

NFA100-E / NFA100:

 

 NFA100-E

 NFA100

 Application

 Mainly developed for R&D purpose. NFA100-E is able to help R&D engineering to find and fix problems in NAND Flash  designing.

 Fit for research institutions, universities, and enterprises.

 Mainly developed for Mass Production purpose. Fit for large scale tests and NAND Flash  sorting.

 No. of NAND 

 Test up to 4 PCs of NAND Flash @ 1 time  Test up to 128 PCs of NAND Flash @ 1 time

PC Connection

USB2.0

USB3.0 & Ethernet  

NFA100 deploys distributed structure. Each Sub-board is designed with independent NAND controller. Parts of test do not take up the Host resources. Thus operation time of NFA100 is shorter than of NFA100-E.
Max design Write Speed: 1GB/s
Max design Read Speed: 1.5GB/s 

 

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